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Program of workshops on "PI and Product Quality and Testing" (28-Apr-98)


Denmark Germany France Ireland Netherlands
9:00-10:00
Welcome (J.Boegh, Delta)
Impressions from EuroSTAR
Welcome (W.Schäfer, University of Paderborn)
Welcome (S.Geyres, SMC)
Using the testing results to improve the QA Process (J.Nellec, SMC Technical manager)
Welcome (R.Messnarz, ISCN)
Welcome/ An introduction to structured testing (E.Van Veenendaal, KEMA)
International session
10:00-11:20
The testing maturity model (K.Olsen, CAP Gemini - DK)
Questions and Answers
VISTA - Improving the software testing process (R.Kamphuis, ECN - NL)
Questions and Answers
Local session + lunch
11:20-14:00
Brain-storm on the use of the News-server
Discussion of the morning's presentations
Watts Humphrey's Personal Software Process and its application in teams (W.Schäfer, Paderborn University)
Exploiting configuration and versioning tools to install reviewing and time measurement in a team software process (A.Zündorf, Paderborn University)
Organising Euro and Year 2000 Validation Testing (M.Lautmann, Banque San Paolo)
Year 2000 Software Testing (F.O'Hara, Insight Consulting)
Building an automated high quality test organization (B.Broekman, IQUIP)
International session
14:00-15:20
CLISERT - Experiences with automated sw testing tools (C.McDonagh, CREDO Group - IRL)
Questions and Answers
The use of year 2000 scenarios in embedded systems (J.Molgaard,, DELTA - DK)
Questions and Answers
Testing embedded software systems (R.Hendriks, Philips TASS - NL)
Local session and conclusion
15:20-17:00
Discussion of the afternoon's presentations
Closing and evaluation
The Mettenmeier Software Quality Process (U.Dunker, Mettenmeier GMBH)
ONEstones tool supported Software Product Quality Process (F.Schrader, ONEstone Information Technologies GmbH)
Workshop wrap up
Modelling a Smartcard for Test Case Generation (F.Hantz, SMC)
Closing and evaluation
Panel Discussion
How to test your year 2000 projects effectively and efficiently
A year 2000 test process incorporating baseline preparation, compliance
Regression testing and future time testing
Critical year 2000 risks and testing issues and how to address them
Analysis of Inspection Data (B.Peeters, Gemeentekrediet - B)
Closing and evaluation
NOTE FOR READING THIS PAGE
the PIE acronym is a link to the PIE synopsis
the PIE name is a link to the slide of the presentation

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